{"id":"https://openalex.org/A5000261078","orcid":null,"observed_orcids":[],"display_name":"Loys Goirand","raw_author_names":["Goirand, Loys","L Goirand","L. Goirand","Loys Goirand"],"full_name":"Goirand, Loys","works_count":25,"cited_by_count":398,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":8,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5000261078","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I2801997478","ror":"https://ror.org/02550n020","display_name":"European Synchrotron Radiation Facility","country_code":"FR","type":"facility","lineage":["https://openalex.org/I2801997478"]},"years":[2023,2018,2017,2016,2015,2014,2010,2008,2007,1995]}],"last_known_institutions":[{"id":"https://openalex.org/I2801997478","ror":"https://ror.org/02550n020","display_name":"European Synchrotron Radiation Facility","country_code":"FR","type":"facility","lineage":["https://openalex.org/I2801997478"]}],"topics":[{"id":"https://openalex.org/T10559","display_name":"Particle Accelerators and Free-Electron Lasers","count":22,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","count":21,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","count":8,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10559","display_name":"Particle Accelerators and Free-Electron Lasers","value":0.0001206,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","value":6.27e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","value":5.28e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","value":1.62e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","value":1.36e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"2776595292","wikidata":"https://www.wikidata.org/wiki/Q919917","display_name":"Storage ring","score":0.94090735912323},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7394358515739441},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6336538195610046},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5112571716308594},{"id":"168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","score":0.50242018699646}],"counts_by_year":[{"year":1995,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":12},{"year":2014,"works_count":2,"oa_works_count":1,"cited_by_count":6},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":9},{"year":2016,"works_count":2,"oa_works_count":2,"cited_by_count":12},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2018,"works_count":5,"oa_works_count":5,"cited_by_count":12},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":17},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":29},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":62},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":66},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":73}],"display_name_alternatives":["Goirand, Loys","L Goirand","L. Goirand","Loys Goirand"],"block_key":"l goirand","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000261078","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}